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93000 Smart Scale alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Teradyne
iFlex
Test & Probe
Teradyne
J 750 EX
Test & Probe
Teradyne J 750 EX is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates devices and identifies dies or parts that meet specification.
Teradyne
J 750 S
Test & Probe
Teradyne J 750 S is a test and probe system used in semiconductor manufacturing. It belongs to the class of equipment that electrically evaluates integrated circuits while they are still on wafer or in related test handling workflows.
Teradyne
MicroFlex
Test & Probe
Teradyne MicroFlex is a test and probe system used for electrical examination of semiconductor devices and wafers. It belongs to the class of equipment that makes controlled contact with device pads or probe sites so signals and measurements can be applied and read back.
Teradyne
Nextest Magnum I PV
Test & Probe
LTX-Credence
TMT ASL 1000 165
Test & Probe
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