Keysight
4062 UX
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
General reference — not yet source-verifiedThe Keysight 4062 UX is a parametric tester used in semiconductor manufacturing. Parametric testers measure electrical parameters of devices on a wafer to verify that the fabrication process is within specification.
How it works
General reference — not yet source-verifiedParametric testers like the 4062 UX use precision source-measure units to force voltage or current and measure the resulting current or voltage at multiple test pads on a semiconductor wafer. The system typically includes a prober that makes electrical contact with the device under test through probe needles.
Where it fits in the process flow
General reference — not yet source-verifiedParametric testing occurs after wafer fabrication is complete, as part of the wafer-level electrical test sequence. The 4062 UX is used in a cleanroom environment, often in a test floor alongside other test and measurement equipment.
What do the numbers mean?
Wafer handling1
Configuration & options3
- complete,working, functional test HP 4062UX. Lead time is 8 to 10 weeks. Please ask your customer to provide their configuration requirements in detail.[2]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 4062 UX are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4062 UX are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4062 UX are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4062 UX are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4062 UX are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4062 UX is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]inventory listing
- [3]fabsurplus.com — fabsurplus.comfabsurplus.com
Last updated Aug 20, 2026.
Compare with similar tools
View all →The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
