Keysight
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The Keysight / Agilent 8517 B is a parametric tester.[1]
A parametric tester applies controlled electrical stimuli to a device under test and measures response parameters such as current, voltage, and leakage behavior.
A probe interface brings measurement contacts to the wafer so device structures can be evaluated before full assembly.
A parametric tester is used during wafer-level evaluation, before downstream assembly and final test.
A probe-based tester belongs near electrical characterization steps, where process engineers verify device behavior on the wafer and screen structures for conformance.
Parametric testers are used for electrical characterization of semiconductor devices and process structures.
Probe-based parametric testing supports measurement of transistors, diodes, capacitors, and other wafer-level structures that require contact-based electrical evaluation.
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The following facts about the 8517 B Parametric are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the 8517 B Parametric are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 8517 B Parametric are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 8517 B Parametric are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 8517 B Parametric are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 8517 B Parametric are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Sep 1, 2026.
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