Veeco
NT 3300
The Veeco / Wyko NT 3300 is a non-contact optical profiler used for surface metrology. The NT 3300 features a 200 mm stage and includes objectives of 10x and 50x with additional barrel options.[1][2][3]
What it is
How it works
General reference — not yet source-verifiedAn optical profiler measures surface topography by sensing variations in height across a sample without contacting the surface.
Optical profilers are used to generate surface profiles and related metrology data for inspection and characterization tasks.
Where it fits in the process flow
General reference — not yet source-verifiedThe NT 3300 fits in the metrology and inspection portion of a fabrication flow, where surfaces and thin-film features are checked after process steps that change topology.
The NT 3300 supports measurement work that can follow lithography, deposition, etching, and other surface-modifying operations.
Applications
What do the numbers mean?
Optics & imaging7
Control & software3
- Manuals & software available[1]
Configuration & options17
Vintage & configurations
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- KLA P 10— Same function class: Metrology & Inspection, nullCompare in depthsource[8]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the NT 3300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT 3300 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the NT 3300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NT 3300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NT 3300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the NT 3300 are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (8)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]nanolab.ucla.edu — nanolab.ucla.edunanolab.ucla.edu
- [3]web.archive.org — veeco.com (Oct 13, 2006)web.archive.org
- [4]Inventory photo
- [5]Inventory photo
- [6]inventory listing
- [7]patents.google.compatents.google.com
- [8]Equipment inventory listing
Last updated Oct 12, 2026.
Compare with similar tools
View all →
The KLA P 10 is a profilometer in the metrology and inspection category.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
