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TMT ASL 1000 165 alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 Smart Scale
Test & Probe
The Advantest 93000 Smart Scale is a test and probe system used in semiconductor device evaluation and sorting. Machines of this class are used to contact device sites, apply test conditions, and record electrical responses for production screening and characterization.
Advantest
93000 SOC
Test & Probe
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
Teradyne
ETS 364
Test & Probe
Teradyne ETS 364 is a test and probe system used to electrically evaluate semiconductor devices. Machines of this class combine probe contact, signal handling, and automated test control for device characterization and screening.
Teradyne
J 750
Test & Probe
Teradyne J 750 is a semiconductor test and probe system used for electrical evaluation of devices during manufacturing. It belongs to the class of automated test equipment that supports wafer or device-level screening before final assembly.
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
Electroglas
1034
Test & Probe
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
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