Cascade Microtech
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Cascade Microtech SQ S 300 M 163 DHT 01 is a prober. The Cascade Microtech SQ S 300 M 163 DHT 01 supports 8-inch wafers.[1]
The Cascade Microtech SQ S 300 M 163 DHT 01 is a prober designed for handling wafers of 8-inch size.[1]
A prober operates by holding the wafer on a vacuum chuck and moving it precisely in X, Y, and Z axes to align the die pads with the needles of a probe card. The probe card is mounted on a probe head that brings the needles into contact with the bonding pads on each die. Once contact is established, a tester sends signals through the probe card to perform electrical measurements or functional tests.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the SQ S 300 M 163 DHT 01 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the SQ S 300 M 163 DHT 01 are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SQ S 300 M 163 DHT 01 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the SQ S 300 M 163 DHT 01 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the SQ S 300 M 163 DHT 01 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the SQ S 300 M 163 DHT 01 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Last updated Sep 1, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.