Waferpedia

Dektak

6M

Wet Processing / Clean6"Dektak 6M family
Research Quality: 30% complete
Dektak6M
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Wafer size

6"

Optics

Steps from 260 microns down to 10 nm[1]

What is it?

The Dektak 6M Stylus Profilometer is listed as cleanroom instrumentation for metrology, microscopy/surface analysis, and surface analysis. The source states that it is a film step-height measurement tool capable of measuring steps from 260 microns down to 10 nm, and that it can also profile surface topography and measure surface roughness in the nanometer range.

What can it run?

Process applications and technology nodes documented for this tool.

  • Film step-height measurement
  • Surface topography profiling
  • Surface roughness measurement

What do the numbers mean?

Optics & imaging1

Measurement range
Steps from 260 microns down to 10 nm[1]
Accurate?

Dimensions & facilities1

Measured feature
Film step height[1]
Accurate?

Configuration & options7

Instrument type
Stylus profilometer[1]
Accurate?
Equipment type
Cleanroom Instrumentation; Metrology; Microscopy/Surface Analysis; Surface Analysis[1]
Accurate?
Additional uses
Surface topography profiling and surface roughness measurement in the nanometer range[1]
Accurate?
Stylus radius
25-micron radius high aspect ratio stylus[1]
Accurate?
Maximum acceptable sample size
6 inches[1]
Accurate?
Location
FNT 4.106[1]
Accurate?
Contact
Dr. Raluca Gearba[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the 6M are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 6M are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 6M are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 6M are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 6M are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 6M is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]tmi.utexas.edutmi.utexas.edutmi.utexas.edu
  2. [2]Instrumentationtmi.utexas.edutmi.utexas.edu
  3. [3]Instrumentationtmi.utexas.edutmi.utexas.edu
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Last updated Jul 29, 2026.

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