Waferpedia

profilometer

Metrology

An instrument that measures surface topography — step heights, roughness, film thickness at an etched step — either by dragging a fine stylus across the surface or by optical interferometry. Profilometers provide quick, direct thickness checks that complement optical film metrology.

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]ProfilometerWikipediaen.wikipedia.org