KLA
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The KLA Alpha Step 10-00030 is a profilometer. The KLA Alpha Step 10-00030 is categorized under metrology and inspection.[1][2]
Profilometers measure changes in surface height by scanning across a sample and converting vertical motion into a surface profile. Profilometers are used in fab and laboratory environments to evaluate topography, quantify step transitions, and support process characterization.
Profilometry is typically used after patterning, deposition, or etch steps when a process engineer needs to verify the height difference between adjacent regions or assess surface shape. Profilometry supports process development, monitoring, and verification rather than material addition or removal.
Profilometers are used to measure step height, surface roughness, trench or line profiles, and the topography created by thin-film and micromachining processes. Profilometers are applied across semiconductor, MEMS, photonics, and related microfabrication work where surface height information is needed for process control and failure analysis.
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The Alpha Step 10-00030 belongs to the metrology and inspection category.[2]
The following facts about the Alpha Step 10-00030 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Alpha Step 10-00030 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Alpha Step 10-00030 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Alpha Step 10-00030 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Alpha Step 10-00030 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Alpha Step 10-00030 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 17, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.