Tool family
The KLA Surfscan 7700 is a particle defect inspection system.
The KLA Surfscan AIT 8010 Particle Defect System is a particle defect inspection system with software version 3.3.2.813 and SECS/GEM CIM.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Surfscan SP 1 TBi | — | — | — | Equipment inventory listing[1] |
The KLA Surfscan SP 1 Classic Particle Defect System is a particle defect inspection system for 6-inch and 8-inch wafers.
The KLA Surfscan SP1 DLS is an unpatterned surface inspection system for defect detection on polished wafers, epi wafers, and engineered substrates.
The KLA Surfscan SP 1 DLS Particle Defect System is a wafer inspection tool cited in sources with 8-inch, 12-inch, and 300mm configurations.
Cited variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| Surfscan SP 1 DLS Particle Defect System, 12 inch | — | 2002 | Listed as a 12-inch configuration with FOUP handler; one source describes it as non-operational, another notes Windows NT, two loadports, and input current details. | Equipment inventory listing[2] |
| Surfscan SP 1 DLS Particle Defect System, 8 inch | — | 2009 | Listed as an 8-inch configuration with a single-station FOUP handler and missing analog boards x2 and DC distribution board. | Equipment inventory listing[3] |
KLA Surfscan SP 1 TBI is an unpatterned wafer inspection system with triple-beam illumination and brightfield capability.
The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.
The KLA Surfscan SP 1 TBI is a particle defect system for wafer inspection, with configurations supporting 8-inch and 12-inch wafers.
The KLA Surfscan SP 1 TBI is a particle measurement tool for 8-inch wafers.
The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.
The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.
The KLA Surfscan 7700 is a particle defect inspection system.
The KLA Surfscan AIT 8010 Particle Defect System is a particle defect inspection system with software version 3.3.2.813 and SECS/GEM CIM.
The KLA Surfscan SP 1 Classic Particle Defect System is a particle defect inspection system for 6-inch and 8-inch wafers.
The KLA Surfscan SP1 DLS is an unpatterned surface inspection system for defect detection on polished wafers, epi wafers, and engineered substrates.
The KLA Surfscan SP 1 DLS Particle Defect System is a wafer inspection tool cited in sources with 8-inch, 12-inch, and 300mm configurations.
KLA Surfscan SP 1 TBI is an unpatterned wafer inspection system with triple-beam illumination and brightfield capability.
The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.
The KLA Surfscan SP 1 TBI is a particle defect system for wafer inspection, with configurations supporting 8-inch and 12-inch wafers.
The KLA Surfscan SP 1 TBI is a particle measurement tool for 8-inch wafers.
The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.
The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.