Waferpedia

Tool family

KLA Surfscan

Models in this family

  1. The KLA Surfscan 7700 is a particle defect inspection system.

  2. The KLA Surfscan AIT 8010 Particle Defect System is a particle defect inspection system with software version 3.3.2.813 and SECS/GEM CIM.

  3. Cited variants

    DesignationGenerationVintageChangesSource
    Surfscan SP 1 TBiEquipment inventory listing[1]
  4. The KLA Surfscan SP 1 Classic Particle Defect System is a particle defect inspection system for 6-inch and 8-inch wafers.

  5. The KLA Surfscan SP1 DLS is an unpatterned surface inspection system for defect detection on polished wafers, epi wafers, and engineered substrates.

  6. The KLA Surfscan SP 1 DLS Particle Defect System is a wafer inspection tool cited in sources with 8-inch, 12-inch, and 300mm configurations.

    Cited variants

    DesignationGenerationVintageChangesSource
    Surfscan SP 1 DLS Particle Defect System, 12 inch2002Listed as a 12-inch configuration with FOUP handler; one source describes it as non-operational, another notes Windows NT, two loadports, and input current details.Equipment inventory listing[2]
    Surfscan SP 1 DLS Particle Defect System, 8 inch2009Listed as an 8-inch configuration with a single-station FOUP handler and missing analog boards x2 and DC distribution board.Equipment inventory listing[3]
  7. KLA Surfscan SP 1 TBI is an unpatterned wafer inspection system with triple-beam illumination and brightfield capability.

  8. The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.

  9. The KLA Surfscan SP 1 TBI is a particle defect system for wafer inspection, with configurations supporting 8-inch and 12-inch wafers.

  10. The KLA Surfscan SP 1 TBI is a particle measurement tool for 8-inch wafers.

  11. The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.

  12. The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.

All entries

  1. Surfscan 5500 Particle DefectKLA
    CategoryMetrology & Inspection
    2 specs
  2. Surfscan 6100 WaferKLA
    CategoryMetrology & InspectionWaferBelow Wafer
    24 specs
  3. Surfscan 7600 Particle DefectKLA
    CategoryMetrology & Inspection
    4 specs
  4. Surfscan 7700 Particle DefectKLA

    The KLA Surfscan 7700 is a particle defect inspection system.

    CategoryMetrology & Inspection
    8 specs
  5. Surfscan AIT 8010 Particle DefectKLA

    The KLA Surfscan AIT 8010 Particle Defect System is a particle defect inspection system with software version 3.3.2.813 and SECS/GEM CIM.

    CategoryMetrology & Inspection
    7 specs
  6. Surfscan SP 1KLA
    1 spec
  7. Surfscan SP 1 ClassicKLA
    WaferFor Wafer Centering Device
    3 specs
  8. Surfscan SP 1 Classic Centering RingKLA
    1 spec
  9. Surfscan SP 1 Classic Particle DefectKLA

    The KLA Surfscan SP 1 Classic Particle Defect System is a particle defect inspection system for 6-inch and 8-inch wafers.

    CategoryMetrology & Inspection
    1 spec
  10. Surfscan SP 1 DLSKLA

    The KLA Surfscan SP1 DLS is an unpatterned surface inspection system for defect detection on polished wafers, epi wafers, and engineered substrates.

    WaferFor Wafer Centering Device
    12 specs
  11. Surfscan SP 1 DLS Centering RingKLA
    1 spec
  12. Surfscan SP 1 DLS Particle DefectKLA

    The KLA Surfscan SP 1 DLS Particle Defect System is a wafer inspection tool cited in sources with 8-inch, 12-inch, and 300mm configurations.

    CategoryMetrology & Inspection
    24 specs
  13. Surfscan SP 1 Particle DefectKLA
    CategoryMetrology & Inspection
    3 specs
  14. Surfscan SP 1 TBIKLA

    KLA Surfscan SP 1 TBI is an unpatterned wafer inspection system with triple-beam illumination and brightfield capability.

    CategoryMetrology & InspectionWafer・When loading with FixLoad, the handler reaches maximum speed, causing wafer misalignment due to recoil
    19 specs
  15. Surfscan SP 1 TBI Centering RingKLA
    1 spec
  16. Surfscan SP 1 TBI ExchangeKLA
    1 spec
  17. Surfscan SP 1 TBI KeyboardKLA

    The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.

    CategoryMetrology & Inspection
    6 specs
  18. Surfscan SP 1 TBI Particle DefectKLA

    The KLA Surfscan SP 1 TBI is a particle defect system for wafer inspection, with configurations supporting 8-inch and 12-inch wafers.

    CategoryMetrology & Inspection
    16 specs
  19. Surfscan SP 1 TBI Particle MeasurementKLA

    The KLA Surfscan SP 1 TBI is a particle measurement tool for 8-inch wafers.

    CategoryMetrology & Inspection
    4 specs
  20. Surfscan SP 2KLA
    2 specs
  21. Surfscan SP 2 Particle DefectKLA
    CategoryMetrology & Inspection
    24 specs
  22. Surfscan SP 3 Particle DefectKLA

    The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.

    CategoryMetrology & InspectionWaferBare wafer inspection station
    10 specs
  23. Surfscan SP 5 Particle DefectKLA

    The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.

    CategoryMetrology & InspectionWaferBare Wafer Inspection Station
    5 specs

Sources

Sources (3)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
  2. [2]Equipment inventory listing
  3. [3]Equipment inventory listing