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A semiconductor prober is a test-floor tool that brings a wafer or device into controlled contact with probe needles or probe cards so electrical measurements can be made before final assembly. A prober is typically paired with external test instrumentation, while the prober itself provides positioning, contact control, and operator-facing wafer or sample handling functions.

A prober operates by positioning a wafer or other sample under a probing interface and then moving the stage and contact hardware until the probe tips land on the intended pads or structures. A semi-automatic prober generally combines operator loading and setup with machine-assisted movement, alignment, and contact routines during measurement.

A prober fits into electrical characterization and wafer sort flows after device patterns and contacts have been formed well enough to support probing. Prober use commonly sits before singulation and packaging, allowing devices or test structures to be screened or characterized while they remain on the wafer or substrate.

Probers are used for wafer-level electrical test, process monitoring, failure analysis support, and engineering characterization. Probers can be applied to semiconductor devices, test keys, and other microfabricated structures that require repeatable electrical contact during measurement.