Tektronix
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Tektronix P 6248 is a prober.[1]
The Tektronix P 6248 is a prober.[1]
Probers such as the P 6248 use a precision stage to align a wafer under a probe card or single probe needle. After optical alignment and contact, the machine lowers the probe tip onto a target pad while an attached test instrument (e.g. parameter analyzer or oscilloscope) measures the device's electrical response. The prober then steps to the next die for automated testing.
The P 6248 operates during the wafer sort (probe) stage, which occurs after fabrication and before final packaging. During wafer sort, each die is electrically tested to classify good and defective devices. Probers interface with a test head and a handler that may be manual, semiautomatic, or fully automatic for wafer transport and alignment.
Be the first to add cited specifications for this tool.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The following facts about the P 6248 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the P 6248 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 6248 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P 6248 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P 6248 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 6248 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Last updated Sep 1, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.