Waferpedia

Tektronix

P 6248

Test & Probe
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Tektronix P 6248 is a prober.[1]

Tektronix logo
Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

What it is

The Tektronix P 6248 is a prober.[1]

How it works

General reference — not yet source-verified

Probers such as the P 6248 use a precision stage to align a wafer under a probe card or single probe needle. After optical alignment and contact, the machine lowers the probe tip onto a target pad while an attached test instrument (e.g. parameter analyzer or oscilloscope) measures the device's electrical response. The prober then steps to the next die for automated testing.

Where it fits in the process flow

General reference — not yet source-verified

The P 6248 operates during the wafer sort (probe) stage, which occurs after fabrication and before final packaging. During wafer sort, each die is electrically tested to classify good and defective devices. Probers interface with a test head and a handler that may be manual, semiautomatic, or fully automatic for wafer transport and alignment.

What do the numbers mean?

No specifications recorded yet

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Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the P 6248 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No specifications for the P 6248 are on record.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 6248 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the P 6248 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the P 6248 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the P 6248 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
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Last updated Sep 1, 2026.

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