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Tokyo Electron

Precio Nano

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Tokyo Electron Precio Nano is a Test & Probe wafer prober. Tokyo Electron Precio Nano is an auto alignment system for needle tip and wafer. Tokyo Electron Precio Nano has a probing accuracy of ±0.8 µm.[1][2]

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Fig. — Manufacturer logo, not a photo of this toolWikimedia Commons (see file page for license)

Wafer size

Auto Alignment System (Needle Tip, Wafer)

Performance

±0.8 µm[2]

Optics

Bridge Camera Unit -II[3]

What it is

Tokyo Electron Precio Nano is a semiconductor test and probe tool. Tokyo Electron Precio Nano is a wafer prober with auto alignment for needle tip and wafer alignment.[3][1][2]

How it works

The Precio Nano uses an auto alignment system for needle tip and wafer alignment. The tool includes chuck camera and bridge camera units, a real time wafer map display, and inspection functions for auto and manual probe mark and needle tip inspection.[3][1]

Where it fits in the process flow

General reference — not yet source-verified

The Precio Nano sits in wafer test and probe operations. The tool is used where wafers are contacted for electrical probing and inspection before downstream use or further test handling.

What do the numbers mean?

Wafer handling12

Wafer size
Auto Alignment System (Needle Tip, Wafer)[3]
Accurate?
Chuck Camera Unit -II[3]
Accurate?
Wafer size
Real Time Wafer Map Display[3]
Accurate?
Loader
Single/Wide/Opener/Right[3]
Accurate?
Chuck Top
HOT[3]
Accurate?
Chuck Force
300 kg[3]
Accurate?
OCR (Wafer ID)
FOCUS[3]
Accurate?
Wafer size
200, 300 mm[2]
Accurate?
Wafer size / system type
Auto Alignment System (Needle Tip, Wafer)[1]
Accurate?
Chuck camera unit
Chuck Camera Unit -II[3]
Accurate?
Real-time wafer map display
Real Time Wafer Map Display[3]
Accurate?
System type
Auto Alignment System (Needle Tip, Wafer)[1]
Accurate?

Optics & imaging4

Bridge Camera Unit -II[3]
Accurate?
PTD (Probe Tip Detector)
150C[3]
Accurate?
Optical system
ASU/BCU-Ⅱ[2]
Accurate?
Bridge camera unit
Bridge Camera Unit -II[3]
Accurate?

Performance3

Probing accuracy
±0.8 µm[2]2 sources
Accurate?
XY probing accuracy
±0.8 µm[2]
Accurate?
Z probing accuracy
±5.0 µm[2]
Accurate?

Control & software3

PSAS (Precio Standard Application Software)[3]
Accurate?
PSAS
Precio Standard Application Software[3]
Accurate?
Software version
Nzz00-P016.12-A[3]
Accurate?

Dimensions & facilities1

Probing force
300/400 kg[2]
Accurate?

Configuration & options17

Alarm Monitor[3]
Accurate?
Inspections (Auto/Manual, Probe Mark/Needle Tip)[3]
Accurate?
Base DD Head Plate (480 SQ)[3]
Accurate?
WAPP
STD (1 plate)[3]
Accurate?
GPIB
I/F w/Cable 4m[3]
Accurate?
LCD Panel
WAGON[3]
Accurate?
S/W version is Nzz00-P016.12-A[3]
Accurate?
Manufacturer
Tokyo Electron[1]
Accurate?
Model
Precio Nano[1]
Accurate?
Category
Test & Probe[1]
Accurate?
Alarm monitor
Alarm Monitor[3]
Accurate?
Inspections
Auto/Manual, Probe Mark/Needle Tip[3]
Accurate?
Base DD head plate
480 SQ[3]
Accurate?
PTD
150C[3]
Accurate?
OCR
FOCUS[3]
Accurate?
Vintage
2010 Vintage[4]
Accurate?
Stage technology
Linear motor[2]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

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Frequently asked questions

Why test at the wafer stage?General reference — not yet source-verified

Wafer-stage testing helps identify good and bad devices before later assembly steps, reducing the use of downstream process time on material that does not meet electrical requirements.

What is the main function of probing hardware in this class?General reference — not yet source-verified

The probing hardware provides controlled, repeatable electrical contact between the measurement system and the target features on the wafer.

Not publicly documented

The following facts about the Precio Nano are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Precio Nano are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Precio Nano are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Precio Nano are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Precio Nano are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Precio Nano is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]flason-smt.com — flason-smt.comflason-smt.com
  3. [3]inventory listing
  4. [4]Equipment inventory listing
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Last updated Oct 13, 2026.

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