Tokyo Electron

It is used in semiconductor test flows to position wafers for electrical probing and related evaluation before later assembly or further sort steps.
A wafer prober mechanically aligns a wafer, brings probe hardware into contact with selected sites, and enables electrical measurements on dies or structures across the wafer. The platform combines precision motion, alignment, and contact control so test equipment can address specific locations repeatably.
In the semiconductor flow, a wafer prober sits in the test and characterization stage, between wafer fabrication and downstream assembly or final package test. It is used while the wafer is still intact so individual devices or test structures can be evaluated at the wafer level.
This class of equipment is used for wafer-level electrical test, parametric characterization, and device screening on semiconductor wafers. It is also used for probing test structures during process development and manufacturing control.
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The following facts about the P 12 XL are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 12 XL are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P 12 XL are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P 12 XL are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 12 XL are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P 12 XL is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Jul 29, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.