Waferpedia

Veeco

Dektak

Dektak — egr.vcu.edu
Fig. 01Dektakegr.vcu.edu[1]
  • Plate 01Veeco Dektak 150 Surface Profiler

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  • Plate 02Veeco Dektak 150 Profiler #63162

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  • Plate 03Veeco Dektak 150 Profiler #61255

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  • Plate 04Veeco Dektak 3 Profiler #61949

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  • Plate 05Veeco Dektak 150 Inv# 64,292

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  • Plate 06Veeco Dektak 3 Surface Profiler No. 63

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  • Plate 07Veeco DEKTAK 150 Profilometer #60749

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What it is

The Veeco Dektak is a stylus surface profiler used for metrology and inspection. It is a scanning instrument for measuring surface topography and thin film step heights.[2]

How it works

The Dektak 150 uses stylus-based scanning and includes manual sample positioning and leveling features. It is intended for profiling surfaces and measuring thin film step heights in the nanometer range.[2]

Where it fits in the process flow

The Dektak 150 is used for surface topography and waviness measurements, as well as surface roughness evaluation. It is also used for thin and thick film step height measurement.[2]

Applications

The instrument is used to measure surface topography, waviness, and roughness, and to determine step heights on thin and thick films.[2]

It is suited to samples up to 200 millimeters in diameter and up to 90 millimeters thick, with long scan capability of 55 millimeters.[2]

  • Measuring surface topography
  • Measuring thin film step heights
  • Measuring surface roughness
  • Measuring waviness

What do the numbers mean?

Control & software1

Leveling
Two-point programmable or cursor software leveling[2]
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Configuration & options15

Manufacturer
Veeco[1]
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Model
DEKTAK 150[1]
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Purpose
Stylus-based scanning system for measuring surface topography and thin film step heights[2]
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Tip Size
12 µm[1]
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Standard Stylus Tip
2.5 μm[2]
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Scan Length
55 - 200 mm[1]
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Maximum Data Points per Scan
120,000[1]
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Maximum Sample Size
200 mm[1]
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Sample Diameter
up to 200 mm in diameter[2]
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Sample Thickness
up to 90 mm thick[2]
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Stylus Force
1 - 15 mg[1]
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X-Y Translation
101.6 x 101.6 mm[2]
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Stage Type
Two-axis, manual sample-positioning stage[2]
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Stage Leveling and Rotation
Manual stage leveling and rotation[2]
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Environmental Enclosure
Acrylic environmental enclosure[2]
Accurate?
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What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

Where are the manuals?

Publicly hosted documents referencing this tool, linked at their original location. Hosted by the linked institutions — availability may change.

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Frequently asked questions

What measurement task is the Dektak 150 used for?

It is used for stylus-based scanning measurements of surface topography and thin film step heights.[2]

What surface characteristics can it measure?

It can profile surface topography and waviness, and it can measure surface roughness.[2]

Not publicly documented

The following facts about the Dektak are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Dektak are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Dektak are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Dektak are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Dektak are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Dektak is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]egr.vcu.eduegr.vcu.eduegr.vcu.edu
  2. [2]uwaterloo.cauwaterloo.cauwaterloo.ca
  3. [3]Get started | NanoFab | Core Facilities | ASUcores.research.asu.educores.research.asu.edu
  4. [4]Fab.nano Equipment Rates External March 2026nanousers.mit.edunanousers.mit.edu
  5. [5]PROF2_OperatingProcedure.pdfsmif.pratt.duke.edusmif.pratt.duke.edu
  6. [6]Veeco Dektak 150 Surface Profiler | UCLA Nanolabnanolab.ucla.edunanolab.ucla.edu
  7. [7]Request Infoveeco.com (Jan 7, 2004)web.archive.org
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Last updated Jul 29, 2026.

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