Waferpedia

EV Group

EVG40

EVG40 — web.archive.org
Fig. 01EVG40web.archive.org[1]

Wafer size

200mm

Optics

High power objectives from 5x to 50x[1]

What is it?

The EVG40 Inspection System is described as a top-to-bottom side alignment accuracy measurement system with non-destructive, visible-light, self-calibrating technology. It is presented as a PC-based measurement system with manual to fully automated versions and basic configurations including standard, advanced, semi-automated, and fully automated units.

What do the numbers mean?

Wafer handling3

Supported wafer or substrate size
Any wafer or substrate material up to 200 mm[1]
Accurate?
Semi-automated basic unit
Alignment stage optics; advanced features include image recognition system, quick transparent overlay, and linewidth measurement mode; automation features include programmable microscope stage rack and motorized chuck rotation[1]
Accurate?
Fully-automated basic unit
Alignment stage optics; advanced features include image recognition system, quick transparent overlay, and linewidth measurement mode; automation features include programmable microscope stage rack, motorized chuck rotation, and robotic autoload cassette-to-cassette[1]
Accurate?

Optics & imaging3

Objective magnification
High power objectives from 5x to 50x[1]
Accurate?
Standard basic unit
Alignment stage optics[1]
Accurate?
Advanced basic unit
Alignment stage optics; advanced features include image recognition system, quick transparent overlay, and linewidth measurement mode[1]
Accurate?

Performance3

Measurement type
Top-to-bottom side alignment accuracy measurement system[1]
Accurate?
Measurement capability
Repeatable top-to-bottom side alignment accuracy measurement[1]
Accurate?
Absolute accuracy
< 0.5 µm with a statistical probability of 99%[1]
Accurate?

Control & software1

Control platform
PC-based measurement system[1]
Accurate?

Configuration & options2

Technology
Non-destructive, visible light, self calibrating technology[1]
Accurate?
Automation range
Manual to fully-automated versions[1]
Accurate?

Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
EVG40 StandardBasic unit with alignment stage opticsweb.archive.org[1]
EVG40 AdvancedBasic unit with alignment stage optics and advanced features including image recognition system, quick transparent overlay, and linewidth measurement modeweb.archive.org[1]
EVG40 Semi-AutomatedBasic unit with alignment stage optics and advanced features including image recognition system, quick transparent overlay, linewidth measurement mode, programmable microscope stage rack, and motorized chuck rotationweb.archive.org[1]
EVG40 Fully-AutomatedBasic unit with alignment stage optics and advanced features including image recognition system, quick transparent overlay, linewidth measurement mode, programmable microscope stage rack, motorized chuck rotation, and robotic autoload cassette-to-cassetteweb.archive.org[1]
EVG40 AUTOMATEDMentioned as a field-upgrade target from the semi-automated versionweb.archive.org[1]
EVG40 Standard Basic UnitAlignment Stage Opticsweb.archive.org[1]
EVG40 Advanced Basic UnitAlignment Stage Optics; Advanced Features: Image Recognition System, Quick Transparent Overlay, Linewidth Measurement Modeweb.archive.org[1]
EVG40 Semi-Automated Basic UnitAlignment Stage Optics; Advanced Features: Image Recognition System, Quick Transparent Overlay, Linewidth Measurement Mode; Automation Features: Programmable Microscope Stage Rack, Motorized Chuck Rotationweb.archive.org[1]
EVG40 Fully-Automated Basic UnitAlignment Stage Optics; Advanced Features: Image Recognition System, Quick Transparent Overlay, Linewidth Measurement Mode; Automation Features: Programmable Microscope Stage Rack, Motorized Chuck Rotation, Robotic Autoload Cassette-to-Cassetteweb.archive.org[1]
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Not publicly documented

Field notes

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Not publicly documented

The following facts about the EVG40 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the EVG40 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the EVG40 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the EVG40 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the EVG40 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the EVG40 are on record.

    Answerable by: an OEM parts catalog or a service engineer

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.orgweb.archive.org
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Last updated Jul 29, 2026.

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