KLA
Plate 01KLA Tencor P 15 Profiler #62240
Plate 02KLA Tencor P-15 Wafer Surface Profilometer System w/ Computer USED (7289)R
Plate 03Kel-Tec P15: The Smallest, Lightest Doublestack 9mm
Plate 04What’s your opinion on the Kel-Tec P15 9mm?
Plate 05Refublished KLA Tencor P15 中古段差測定器
Plate 06What Do You Guys Think About The New Budget Friendly Kel-Tec P15? Cop or Drop? #Viral #Fyp #Ytshorts
Wafer size
200mm
Vacuum
200 mm sample table with vacuum[1]
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
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The following facts about the P-15 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P-15 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P-15 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P-15 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P-15 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P-15 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Jul 29, 2026.
Veeco Dektak 150 is a stylus-based surface profiler used for measuring surface topography and thin film step heights.
The KLA Archer 10 XT Overlay System is a 200mm overlay metrology system with refurbishment-upgraded components and software version 5.6.
EVG40 is an EV Group top-to-bottom side alignment accuracy measurement inspection system for non-destructive measurement of repeatable alignment accuracy.
The KLA Tencor P-2 is a profilometer with a 200 mm sample table with vacuum and a 3D scan option.