Advanced Packaging

The Denton SJ20C is an electron-beam evaporation tool used for physical vapor deposition of a wide range of materials.

The Applied Materials Centura Ultima+ HDP is a chemical vapor deposition system for 6-inch wafers, equipped with an ENI AM200 RF generator.

The Denton Explorer 14 RF Sputterer is an RF sputterer manufactured by Denton Vacuum.

The Lam / Novellus / Gasonics Triple Speed NF is a chemical vapor deposition (CVD) system with three HDP chambers, a Brooks robot, SLM type, three ports, and loadlock helium reduction.

The Applied Materials Producer III is a chemical vapor deposition (CVD) system.

The EVG 101 is an advanced resist processing system for spin or spray coating and developing of wafers up to 300 mm.

The KLA FT-750 is a visible light spectrophotometer-based thin film measurement system for semiconductor process control.

The Laurell SU-8 is a spin station dedicated to applying SU-8 photoresist for lithography processes.

The SUSS MicroTec MA 8 / BA 6 Wafer is a wafer aligner categorized under Lithography.

The Buehler Isomet 4000 is a precision linear sectioning saw.

The Disco 3220 is a dicing saw used for wafer singulation in semiconductor backend processing.

The Meyer Burger DW 288 S4 multi wire saw is designed for slicing semiconductor silicon and sapphire into wafers.

The Accretech ACS 100 A is a cleaning after dicer system used in semiconductor dicing and grinding operations.

The Disco DAD 3350 is an automatic dicing saw.

The Buehler Ecomet 3000 is a variable speed grinder/polisher with an 8-inch aluminum platen and speed range from 10 to 500 rpm.

The Logitech 1 DP 41 is a polisher with 3-phase, 50/60 Hz, 480 V, 12 amp electrical requirements.

MRSI-HVM1 is a high-volume manufacturing flip-chip die bonder with 1 micron accuracy.

The Wyko SP3200 is a gauge-capable advanced packaging profiling system for in-line process monitoring of flip-chip packaging.

The K&S 4524 D is a Digital Series manual wire bonder.

The ESEC ESEC_2100HS is an automatic epoxy die bonder. The ESEC ESEC_2100HS appears in the category of semiconductor assembly die bonders.

The Disco DAD3240 is an automatic dicing saw used for cutting semiconductor wafers into individual chips or dies.

Tokyo Electron Clean Track Act 8 is a DUV clean track system for 8-inch wafers.

The Semitool 270 S L SRD is an automated spin rinse dryer used in semiconductor wafer processing.

ASML SERV.470.54502 is a sealed cleanroom part designated as an OIU Trackball Assembly.

The SCREEN / DNS 80 EX Wafer Scrubber is a wafer scrubber with 4 cleaning units, brush cleaning, and CO2 high-pressure washing.

The CEE Apogee 300 Bake Plate is a semiconductor wafer bake plate for up to 300mm wafers with recipe-controlled thermal processing and DataStream™ logging.

The Tokyo Electron A 8 S ZA is a PoCl3 furnace with an EPROM based control system.

The YES 12-2P-CP is a manual-load high-temperature cure oven for MEMS and semiconductor process applications.

The Despatch LCD1-16NV-3 is an oven for polymer curing with nitrogen circulation, a HEPA filter, and temperature monitoring capability.

The Samsung Galaxy S 4G is a smartphone released in February 2011 with a 4.0-inch Super AMOLED display, 1 GHz Hummingbird processor, and 5 MP camera.

The Hitachi S 9200 is a scanning electron microscope (SEM) used for critical dimension (CD) measurements and wafer inspection, designed for 8-inch wafer processing.

The FEI Nova 600i (also called Nova NanoLab 600i) is a DualBeam system combining a field emission scanning electron microscope (FESEM) with a gallium focused ion beam (Ga FIB) for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.

The Leica DM2700 M is an upright materials microscope with universal white light LED illumination designed for routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research.

The ZEISS Axioscope 5 is a smart upright microscope designed for biomedical routine and research, featuring automatic digital documentation with a Snap button and support for multiple contrast techniques.

The Filmetrics R50 – 200 – 4PP is a metrology tool configured by default for metallic layers and sample thicknesses of 525 µm ± 25 µm.

The Agilent 11729C Carrier Noise Test Set is an integral part of a phase noise measurement system, capable of up-converting, down-converting, and phase/frequency demodulation.

The Electroglas EG 6000 e is a wafer prober used in semiconductor test and probe applications.

The ESPEC 212M is an environmental test chamber model documented in two user manuals on MetrologyManuals.

The Rasco SO 2000 Handler is a dual-temp tube-to-tube handler for SSOP 8 and 16 packages with 4 sites.